TELKOMNIKA Telecommunication, Computing, Electronics and Control
A new factor for fabrication technologies evaluation for silicon nanowire transistors
Dublin Core
Title
TELKOMNIKA Telecommunication, Computing, Electronics and Control
A new factor for fabrication technologies evaluation for silicon nanowire transistors
A new factor for fabrication technologies evaluation for silicon nanowire transistors
Subject
AFM, IC, Nanolithography, SiNWT, Transistor
Description
This paper reviews the fabrication technologies of silicon nanowire
transistors (SiNWTs) and rapidly development in this area, as this paper
presents various types of SiNWT structures, development of SiNWT
properties and different applications until nowadays. This research provides a good comparison among fabrication technologies of SiNWTs depending on a new factor DIF, this factor depends on the size of channel and power consumption in channel. As a result of this comparison, the best technology to use in the future to fabricate silicon nano transistors for future ICs is AFM nanolithography.
transistors (SiNWTs) and rapidly development in this area, as this paper
presents various types of SiNWT structures, development of SiNWT
properties and different applications until nowadays. This research provides a good comparison among fabrication technologies of SiNWTs depending on a new factor DIF, this factor depends on the size of channel and power consumption in channel. As a result of this comparison, the best technology to use in the future to fabricate silicon nano transistors for future ICs is AFM nanolithography.
Creator
Yasir Hashim, Mohammed Nazmus Shakib
Source
DOI: 10.12928/TELKOMNIKA.v18i5.12121
Publisher
Universitas Ahmad Dahlan
Date
October 2020
Contributor
Sri Wahyuni
Rights
ISSN: 1693-6930
Relation
http://journal.uad.ac.id/index.php/TELKOMNIKA
Format
PDF
Language
English
Type
Text
Coverage
TELKOMNIKA Telecommunication, Computing, Electronics and Control
Files
Collection
Citation
Yasir Hashim, Mohammed Nazmus Shakib, “TELKOMNIKA Telecommunication, Computing, Electronics and Control
A new factor for fabrication technologies evaluation for silicon nanowire transistors,” Repository Horizon University Indonesia, accessed February 5, 2025, https://repository.horizon.ac.id/items/show/4027.
A new factor for fabrication technologies evaluation for silicon nanowire transistors,” Repository Horizon University Indonesia, accessed February 5, 2025, https://repository.horizon.ac.id/items/show/4027.