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TELKOMNIKA Telecommunication, Computing, Electronics and Control
Modifying Hamming code and using the replication method to protect memory against triple soft errors
As technology scaling increases computer memory’s bit-cell density and
reduces the voltage of semiconductors, the number of soft errors due to
radiation induced single event upsets (SEU) and multi-bit upsets (MBU) also increases. To address this,…
reduces the voltage of semiconductors, the number of soft errors due to
radiation induced single event upsets (SEU) and multi-bit upsets (MBU) also increases. To address this,…
Safety and Health at Work Vol. 12 Issue 4 2021
Reliability and Validity of a Nationwide Survey (the Korean Radiation Workers Study) (Original article)
Background: This study aimed to evaluate the reliability and validity of the self-administered questionnaire for Korean radiation workers.
Methods: From May 24, 2016, to June 30, 2017, 20,608 participants completed the questionnaire, providing…
Methods: From May 24, 2016, to June 30, 2017, 20,608 participants completed the questionnaire, providing…