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TELKOMNIKA Telecommunication, Computing, Electronics and Control
Modifying Hamming code and using the replication method to protect memory against triple soft errors
As technology scaling increases computer memory’s bit-cell density and
reduces the voltage of semiconductors, the number of soft errors due to
radiation induced single event upsets (SEU) and multi-bit upsets (MBU) also increases. To address this,…
reduces the voltage of semiconductors, the number of soft errors due to
radiation induced single event upsets (SEU) and multi-bit upsets (MBU) also increases. To address this,…